Features

• Input Voltage Range: 3 V to 36 V
• Output Voltage Noise: 4 µVRMS (10 Hz, 100 kHz)
• Power-Supply Ripple Rejection:
  • 82 dB (100 Hz)
  • ≥ 55 dB (10 Hz, 10 MHz)
• Two Output Voltage Modes:
  • ANY-OUT™ Version (User-Programmable Output via PCB Layout):
    • No External Feedback Resistors or Feed-Forward Capacitors Required
    • Output Voltage Range: 1.4 V to 20.5 V
  • Adjustable Version:
    • Output Voltage Range: 1.4 V to 34 V
• Output Current: 1 A
• Dropout Voltage: 307 mV at 1 A
• CMOS Logic Level-Compatible Enable Pin
• Built-In Fixed Current Limit and Thermal Shutdown
• Available in High-Performance Thermal Package: 5-mm × 5-mm QFN
• Operating Temperature Range: –55°C to 125°C
• Supports Defense, Aerospace, and Medical Applications:
  • Controlled Baseline
  • One Assembly/Test Site
  • One Fabrication Site
  • Available in Extended (–55°C to 125°C) Temperature Range
  • Extended Product Life Cycle
  • Extended Product-Change Notification
  • Product Traceability

Texas Instruments  TPS7A4701MRGWREP

The TPS7A4701-EP is a positive voltage (36 V), ultra-low-noise (4 µVRMS) low-dropout linear regulators (LDO) capable of sourcing a 1-A load.

The TPS7A4701-EP output voltage can be configured with a user-programmable PCB layout (up to 20.5 V), or adjustable (up to 34 V) with external feedback resistors.

The TPS7A4701-EP is designed with bipolar technology primarily for high-accuracy, high-precision instrumentation applications where clean voltage rails are critical to maximize system performance. This feature makes the device ideal for powering operational amplifiers, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and other high-performance analog circuitry in critical applications such as medical, radio frequency (RF), and test-and-measurement.

In addition, the TPS7A4701-EP is ideal for post DC-DC converter regulation. By filtering out the output voltage ripple inherent to DC-DC switching conversions, maximum system performance is ensured in sensitive instrumentation, test-and-measurement, audio, and RF applications.